Seio, Kohji; Wada, Takeshi; Sekine, Mitsuo Helvetica Chimica Acta, 2000, vol. 83, # 1 p. 162 - 180 doi: 10.1002/(SICI)1522-2675(20000119)83:1<162::AID-HLCA162>3.0.CO;2-Y